我们的IC测试探针可适用0.012mm的极小间距

18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147

Double active, 6.98mm, IC Test Probe, 0.35mm Diameter, DE1-035DF56-02A0

Single active, 3.3 mm, IC Test Probes, 0.31 mm Diameter

 

产品料号	DE3-031DF21-01A0
内部结构	单动
长度	3.30 mm
针管外径	0.31 mm
测试探针头型	4 Points Crown(F)
板端测试头型	Sphere(D)

Double active, 6.86mm, IC Test Probe, 0.35mm Diameter, 1A, DE1-035EG57-01A0

 

产品料号	DE1-035EG57-01A0
内部结构	双动
长度	6.86 mm
针管外径	0.35 mm
测试探针头型	Conical 90º,120º(E)
板端测试头型	Flat(G)
额定电流	1
接触电阻	50

Double active, 5.7 mm, IC Test Probes, 0.31 mm Diameter, 1A

Double active, 4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A

Single active, 2.2 mm, IC Test Probes, 0.29 mm Diameter, A

Single Active, 3.3 mm, IC Test Probes, 0.31 mm Diameter, 1A

Single active, 3.5 mm, IC Test Probes, 0.35 mm Diameter, 1A

Single active, 3.3 mm, IC Test Probes, 0.35 mm Diameter, A

Single active, 3 mm, IC Test Probes, 0.56 mm Diameter, 1A

Double active, 4.6 mm, IC Test Probes, 0.26 mm Diameter, 1A

Double active, 3.3 mm, IC Test Probes, 0.31 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 4.75 mm, IC Test Probes, 0.31 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.31 mm Diameter, 1A

Single active, 2.8 mm, IC Test Probes, 0.28 mm Diameter, A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double Active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.31 mm Diameter, A

Double active, 3.3 mm, IC Test Probes, 0.31 mm Diameter, 1A

Double active, 4.8 mm, IC Test Probes, 0.38 mm Diameter, 1A

Single active, 2.85 mm, IC Test Probes, 0.31 mm Diameter, A

Single active, 2.8 mm, IC Test Probes, 0.28 mm Diameter, A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double Active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.31 mm Diameter, A

Double active, 2 mm, IC Test Probes, 0.35 mm Diameter, A

Double active, 5.7 mm, IC Test Probes, 0.38 mm Diameter, A

Double active, 7.8 mm, IC Test Probes, 0.38 mm Diameter, 1A

Single active, 3.3 mm, IC Test Probes, 0.31 mm Diameter, A

Single active, 3.3 mm, IC Test Probes, 0.31 mm Diameter, 1A

Single active, 3.3 mm, IC Test Probes, 0.26 mm Diameter, 1A

Single active, 3.35 mm, IC Test Probes, 0.35 mm Diameter, 1A

Single active, 3.2 mm, IC Test Probes, 0.35 mm Diameter, 1A

single active, 3 mm, IC Test Probes, 0.56 mm Diameter, 1A

double active, 3.3 mm, IC Test Probes, 0.31 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.38 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.26 mm Diameter, 1A

Double active, 7.6 mm, IC Test Probes, 0.28 mm Diameter, A

Double active, 5.7 mm, IC Test Probes, 0.38 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.26 mm Diameter, 1A

Double active, 7.6 mm, IC Test Probes, 0.28 mm Diameter, A

Single active, 3.3 mm, IC Test Probes, 0.51 mm Diameter, 1A

Single active, 2.57 mm, IC Test Probes, 0.52 mm Diameter, 1A

Single active, 2.85 mm, IC Test Probes, 0.56 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.2 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.26 mm Diameter, 1A

Double active, 4.6 mm, IC Test Probes, 0.26 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A

Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A